Real-world limits on the performance of imaging systems by the quality of available optics and data acquisition process. A significant challenge for R&D is to reliably understand the true performance of imaging tools. HighRI offers a Binary Pseudo Random Array (BPRA) test artifact with an intrinsic white noise power spectral density to measure the optical response of metrology tools. The BPRA test artifacts provide a straightforward and easy-to-use method for characterizing imaging response and enable fleet normalization of metrology tools.
Enhance accuracy and reliability with our advanced metrology solutions. Designed for high-performance applications, our technology ensures precise measurements for optimal results.
Binary Pseudo Random Test standards are patented technology that offers unparalleled benefits to thoroughly characterize the imaging systems. BPRA test standards contain variation at all spatial frequencies visible to the imaging system at all positions in the field of view. Such “white-noise” patterns would result in a flat spatial-frequency response (a constant power spectral density, PSD) when recorded with an ideal imaging system. For a real imaging system, the observed deviation from a flat PSD is a measure of the ITF over the entire dynamic range of the instrument.
We offer BPRA test standards with minimum feature sizes between 3 nm – 15 µm, to cover high to mid spatial frequencies.
BPRA test standards can be custom fabricated for specific applications.
Binary Pseudo Random Test standards are patented technology that offers unparalleled benefits to thoroughly characterize the imaging systems. BPRA test standards contain variation at all spatial frequencies visible to the imaging system at all positions in the field of view. Such “white-noise” patterns would result in a flat spatial-frequency response (a constant power spectral density, PSD) when recorded with an ideal imaging system. For a real imaging system, the observed deviation from a flat PSD is a measure of the ITF over the entire dynamic range of the instrument.
We offer BPRA test standards with minimum feature sizes between 3 nm – 15 µm, to cover high to mid spatial frequencies.
BPRA test standards can be custom fabricated for specific applications.
Explore some of the most relevant publications from experts using BPRA technology. Discover how BPRA enhances precision in surface texture measurements and interferometry.
HighRI Optics, Inc. is a spin-off company of aBeam Technologies, Inc. headquartered in Oakland, CA.
We develop advanced optical materials and applications. Our proprietary and patented high refractive index optical materials enable advanced optics applications. Fiber nanoimprint technology dramatically simplifies light manipulation at the nanometer scale.