09/19/2024 HighRI Optics, Inc. is one of the first small businesses to receive CHIPS R&D funding aimed at advancing U.S. semiconductor research!...
π HighRI Optics at NNT (2024) NIL Industrial Day! π
π HighRI Optics at NNT (2024) NIL Industrial Day! Β π Weβre thrilled to announce that HighRI Optics will be an exhibitor and presenter at the...
Join us at the OPTICA event! May 17th, 2024
San Francisco, CAΒ β May 1st, 2024 Join us at the OPTICA event! HighRI Optics will deliver an invited talk at the upcoming OPTICA SILICON VALLEY...
HighRI Optics is going to 2024 SPIE Advanced Lithography in San Jose, CA!
San Francisco, CAΒ β February 26th, 2024 Happening this Thursday 2/29 at 8:30 am! We invite you to come to our technical presentation at SPIE...
HighRI Optics is going to 2024 SPIE AR | VR | MR
San Francisco, CAΒ β January 8th, 2024 HighRI Optics, Inc. will have a booth and a talk at 2024 SPIE AR | VR | MR in San Francisco! Visit our booth...
HighRI Optics is going to 2024 SPIE Photonic West
San Francisco, CAΒ β January 8th, 2024 HighRI Optics, Inc. will have a booth and a talk at 2024 SPIE Photonic West in San Francisco! Visit our booth...
HighRI Optics is going to 2023 NNT Boston
San Francisco, CAΒ β September 17, 2023 HighRI Optics, Inc. will exhibit at the Nanoimprint and Nanoprint Technologies (NNT) 2023 Conference in...
HighRI Optics at 2023 EIPBN San Francisco
San Francisco, CAΒ - May 23, 2023 HighRI Optics, Inc. will exhibit at the 2023 EIPBN (3 Beams) show in San Francisco! We're excited to see you!...
HighRI Optics is going to 2023 NILIndustrial Day
San Francisco, CAΒ - April 3, 2023 HighRI Optics will give an invited presentation about our high refractive index materials optimized for...
Press Release
HIGHRI OPTICS ANNOUNCES NEW HIGH REFRACTIVE INDEX (RI) MATERIALS AT PHOTONIC WEST 2023
HighRI Optics Launches New Website
HighRI Optics Launches New Website.
Binary pseudo-random array test
We describe a technique for measuring the instrument transfer function (ITF) of an interferometric microscope, allowing both characterization and data processing to increase the fidelity and effective resolution of the tool.